Risk-based-testing reduces time to market of dynamic EDA tools
The integrated circuit (IC) industry uses electronic design automation (EDA) tools in its iterative cycle of analyzing, designing, and verifying ICs. Industry growth creates a need for improved and expanded functionality that performs processes with fewer resources in a shorter timeline with a very low risk of failures. The functional complexity of EDA tools continually increases as we strive to provide the most efficient and most accurate utilities.
When tool quality is critical, the risk of failure must be minimized. Risk-based-testing (RBT) attempts to allocate test efforts in relation to customer priorities; With limited resources and time constraints, a finite number of combinations can be covered. Risk identification and analysis are critical components of targeted effort allocation.
In this paper, RBT will be applied to 'Create Random Array' (CRA) and 'VIA Random Placement' (VRP) which are highly dynamic tools and it is guaranteed that applying the RBT technique will reveal critical bugs as early as possible and could significantly reduce time to market while ensuring tool quality. The results include metrics for measuring and controlling the progress, efforts, and costs of test activities. We also show that RBT is applicable to any tool operating in a dynamic environment with limited. 1- The technique of Risk-based-testing
2- Risk Activities
3- Likelihood Factors
4- Impact Factors
5- Metrics to measure the efficiency of applying the technique in testing
6- Using RBT in revealing bugs in the early stages of the development process
Mohamed Bahnasawi, Mohamed A. Bahnasawi
Ahmed Khater, Ahmed Khater
Reem ElAdawy Reem El Adawy